DEVICE AND METHOD FOR TESTING ELECTRONIC COMPONENT DEVICES ON A CARRIER OR A SUBSTRATE
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United States of America Patent
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Issued Date -
Dec 19, 2013
app pub date -
Jun 10, 2013
filing date -
Jun 14, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A device for testing electronic component devices on a carrier or a substrate, having a positioning and holding device for the earner or the substrate, a test head and a test socket connected thereto, with which multiple simultaneous electronic component devices on the carrier or the substrate are contactable. At least one additional test socket is connected to the test head.
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