METHOD AND SYSTEM FOR ANALYZING A SAMPLE
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United States of America Patent
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Issued Date -
Dec 5, 2013
app pub date -
Aug 10, 2011
filing date -
Aug 10, 2010
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Abandoned
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Abstract
A method and system for analysing a sample are provided, wherein one or more process steps and/or sample processors are provided separately from the instrument, for instance a sample receiving step and sample preparation step and sample extraction step and sample retention step and/or purification step and washing step and elution step, and one or more process steps and/or sample processors provided by the instrument as an integrated set, the one or more process steps and/or sample processors provided by the instrument including a sample receiving step and amplification step and denaturing step and investigation step and detection step and results analysis step and results output step. Other combinations of the split in location of the steps are possible. The optimisation of the split allows the accurate processing by a cartridge based instrument of the sample, whilst fully interfacing with a variety of sample collection and/or preparation approaches.
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