SYSTEM AND METHOD FOR MEASURING INTERNAL DIMENSIONS OF AN OBJECT BY OPTICAL COHERENCE TOMOGRAPHY

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20130321822A1
SERIAL NO

13984956

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A system is provided for optically measuring internal dimensions of a sample object comprising internal interfaces at which the refraction index changes so that a portion of incident light is backreflected and/or backscattered and can be detected by means of optical coherence tomography. The system comprises at least one first OCT device adapted to measure internal dimensions in a first partial volume of the object and at least one second OCT device adapted to measure internal dimensions in a second partial volume of the same object, wherein the second partial volume is at least partially different from the first partial volume. The first and second OCT devices may share at least partially spatially superimposed first and second sample arms, which may have respective different focal lengths and pass through a common optical lens system toward the object

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
WAVELIGHT GMBH91058 ERLANGEN

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Donitzky, Christof Eckental/Eschenau, DE 92 832
Gorschboth, Claudia Nurnberg, DE 19 78
Vogler, Klaus Eckental/Eschenau, DE 65 627
Wuellner, Christian Moehrendorf, DE 13 88

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation