TEST DEVICE, TEST SYSTEM, METHOD AND CARRIER FOR TESTING ELECTRONIC COMPONENTS UNDER VARIABLE PRESSURE CONDITIONS
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United States of America Patent
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Issued Date -
Dec 5, 2013
app pub date -
May 29, 2013
filing date -
Jun 5, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A test device, a test system, a method and a carrier for testing electronic components under variable pressure conditions comprise: a first chamber half and a second chamber half, a first gasket and a second gasket, a carrier segment adapted to carry a plurality of electronic components, and a circular carrier section surrounding the carrier segment. The circular carrier section comprises a first side and a second side. The first gasket is placed between the first chamber half and the first side of the circular carrier section to form an airtight seal and the second gasket is placed between the second chamber half and the second side of the circular carrier section to form an airtight seal.
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