Specimen analysis system, specimen analyzer, and specimen analysis method
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United States of America Patent
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Apr 11, 2017
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N/A
app pub date -
Aug 2, 2013
filing date -
Feb 3, 2011
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Abstract
A specimen analysis system, a specimen analyzer, and a specimen analysis method are provided by which reexamination of a specimen can be executed more quickly than in conventional technology. A specimen analyzer measures a specimen and obtains an analysis result. The specimen analyzer determines the necessity of remeasurement of the specimen, based on a specimen analysis result. Also, the specimen analyzer determines, based on the specimen analysis result, whether or not determination of the necessity of remeasurement of the specimen based on examination information by the examination information management device is necessary. If it is determined that determination of the necessity of remeasurement of the specimen based on the examination information is necessary, the specimen analyzer makes a request to determine the necessity of remeasurement of the specimen based on the examination information, to the examination information management device.
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