Transistor Overcurrent Detection
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United States of America Patent
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Issued Date -
Nov 28, 2013
app pub date -
May 24, 2012
filing date -
May 24, 2012
priority date (Note) -
Abandoned
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Abstract
Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/or blank-time-qualified fault sensing.
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