DEVICE AND METHOD FOR DETERMINING A MEASURING CAPACITANCE
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United States of America Patent
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Issued Date -
Nov 28, 2013
app pub date -
Mar 11, 2013
filing date -
Apr 24, 2012
priority date (Note) -
Abandoned
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Abstract
A measuring device determines a measuring capacitance (CM), with a clock oscillator, which oscillates in a scanning frequency (fA), a measuring oscillator, which oscillates in a measurement frequency in dependence on a measuring capacitance (CM), and an edge counter, which counts the number of clock oscillations during a given number of measuring oscillations, wherein a circuit is provided for measurement refinement, wherein the circuit for measurement refinement is started by a measuring edge of a last scanned measuring oscillation and stopped by an equally oriented and immediately following edge of a subsequent clock oscillation.
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