METHOD AND APPARATUS OF MEASURING DEPTH OF OBJECT BY STRUCTURED LIGHT
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Nov 7, 2013
app pub date -
Mar 11, 2013
filing date -
Mar 19, 2012
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A method and an apparatus of measuring a depth of an objection by structured light are disclosed. The method may comprise: projecting structured light from a light source to the object through a structured light mask; capturing a first projection image from the structured light reflected by the object, and deriving a first depth value at a first positional point from the first projection image; moving the structured light mask within a prescribed range to project further structured light to the object; capturing a second projection image from the further structured light reflected by the object, and deriving a second depth value at a second positional point from the second projection image; and acquiring a plurality of the second depth values, and performing calculation on the first depth value and the respective second depth values in accordance with a predetermined rule to derive a resultant depth value.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully