LASER LINE PROBE THAT PRODUCES A LINE OF LIGHT HAVING A SUBSTANTIALLY EVEN INTENSITY DISTRIBUTION
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United States of America Patent
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Issued Date -
Oct 31, 2013
app pub date -
Jan 11, 2013
filing date -
Dec 28, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A laser line probe (LLP) configured to measure an object is provided. The LLP includes a projector, a camera, a bracket, and an electronic circuit. The projector includes a light source, a first lens system and a continuously varying neutral density filter. The projector is configured for generating a line of light having a substantially even intensity distribution and for projecting the line of light onto the object. The camera includes a second lens system and a photosensitive array. The second lens system is configured to collect the light reflected by or scattered off the object as a first collected light and to image the first collected light onto the photosensitive array. The electronic circuit includes a processor and is configured to determine three-dimensional coordinates of a plurality of points of light projected on the object by the projector.
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