METHODS AND APPARATUS FOR X-RAY DIFFRACTION
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United States of America Patent
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Issued Date -
Oct 24, 2013
app pub date -
Apr 19, 2012
filing date -
Apr 19, 2012
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Abstract
Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. Modifications of the technique are described to suppress fluorescence signals that would otherwise obscure the diffraction signals.
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