METHOD FOR NON-DESTRUCTIVE QUANTITATIVE DETERMINATION OF THE INTERNAL MICROSTRESS OF TYPE II AND/OR TYPE III
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United States of America Patent
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Issued Date -
Oct 24, 2013
app pub date -
Mar 21, 2013
filing date -
Apr 3, 2012
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Abandoned
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Abstract
The present invention relates to methods for non-destructive quantitative determination of the internal microstresses of type II and/or III which are based on subtraction of the maximum values of the load stress dependency of the maximum Barkhausen noise amplitudes on a test piece before and after hardening of the test piece in specific thermal hardening states. The present invention hence enables independent determination of the internal microstress of type II or III, simultaneous and resolved determination of the internal microstresses of type II and III and also determination of the sum of both types of internal microstresses.
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