MEASUREMENT OF LIGHT-ABSORPTION QUALITIES IN THE VISIBLE SPECTRUM USING A CAMERA
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United States of America Patent
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N/A
Issued Date -
Oct 3, 2013
app pub date -
May 21, 2012
filing date -
Mar 28, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
To analyze a sample, an image comprising a calibration chart region and a representation of the sample is accessed. The calibration chart region has multiple reference markers. The reflectance value for each of the reference markers is determined. In one example, the reflectance value may be reflectance values in the red wavelength. Each of the reflectance values is associated with a quantity value corresponding to the reference markers. An exponential function relating the reflectance values and the associated quantity values is determined. The reflectance value for the representation of the sample is determined. In one example, the reflectance value for the sample may be the reflectance value in the red wavelength. A quantity value of the sample is determined based on evaluating the exponential function using the sample reflectance value.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
NEXLEAF ANALYTICS | 2356 PELHAM AVENUE LOS ANGELES CA 90064 |
International Classification(s)

- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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LUKAC, Martin Ladislav | Los Angeles, US | 2 | 5 |
RAMANATHAN, Nithya | Los Angeles, US | 2 | 5 |
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