METHODS OF MEASURING A CHARACTERISTIC OF A CREPING ADHESIVE FILM AND METHODS OF MODIFYING THE CREPING ADHESIVE FILM
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United States of America Patent
Stats
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N/A
Issued Date -
Sep 19, 2013
app pub date -
Mar 14, 2013
filing date -
Mar 19, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
KEMIRA OYJ | ENERGIAKATU 4 HELSINKI 00180 |
International Classification(s)

- 2013 Application Filing Year
- G01H Class
- 187 Applications Filed
- 153 Patents Issued To-Date
- 81.82 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Grigoriev, Vladimir | Atlanta, US | 19 | 194 |
# of filed Patents : 19 Total Citations : 194 | |||
Lu, Chen Tampa | Marietta, US | 1 | 5 |
# of filed Patents : 1 Total Citations : 5 | |||
Nguyen, Danny | Norcross, US | 15 | 111 |
# of filed Patents : 15 Total Citations : 111 | |||
Rosencrance, Scott | Douglasville, US | 33 | 252 |
# of filed Patents : 33 Total Citations : 252 |
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Patent Citation Ranking
- 5 Citation Count
- G01H Class
- 3.70 % this patent is cited more than
- 12 Age
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