METHODS OF MEASURING A CHARACTERISTIC OF A CREPING ADHESIVE FILM AND METHODS OF MODIFYING THE CREPING ADHESIVE FILM

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United States of America Patent

APP PUB NO 20130245158A1
SERIAL NO

13804005

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film.

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Patent Owner(s)

Patent OwnerAddress
KEMIRA OYJENERGIAKATU 4 HELSINKI 00180

International Classification(s)

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  • 2013 Application Filing Year
  • G01H Class
  • 187 Applications Filed
  • 153 Patents Issued To-Date
  • 81.82 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201320142015201620172018201920200255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Grigoriev, Vladimir Atlanta, US 19 194
Lu, Chen Tampa Marietta, US 1 5
Nguyen, Danny Norcross, US 15 111
Rosencrance, Scott Douglasville, US 33 252

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Patent Citation Ranking

  • 5 Citation Count
  • G01H Class
  • 3.70 % this patent is cited more than
  • 12 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges24551101 - 1011 - 2021 - 3031 - 4002.557.51012.51517.52022.52527.53032.53537.54042.54547.5

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