CO-FACIAL ANALYTICAL TEST STRIP WITH STACKED UNIDIRECTIONAL CONTACT PADS AND INERT CARRIER SUBSTRATE

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United States of America Patent

SERIAL NO

13585330

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An analytical test strip with inert carrier substrate for use with a test meter includes an analytical test strip module and an electrochemically and electrically inert carrier substrate. The analytical test strip module has a first electrode portion, a second electrode portion in an opposing relationship to the first electrode portion, and first and second electrical contact pads configured in a stacked unidirectional configuration. The electrochemically and electrically inert carrier substrate has an upper surface and an outer edge. Moreover, the analytical test strip module is attached to the upper surface of the electrochemically and electrically inert carrier substrate such that the first and second electrical contact pads extend beyond the outer edge of the electrochemically and electrically inert carrier substrate and such that the electrochemically and electrically inert carrier substrate extends beyond the analytical test strip module.

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Patent Owner(s)

Patent OwnerAddress
CILAG GMBH INTERNATIONALGUBELSTRASSE 34 ZUG 6300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ritchie, Lawrence Julian Inverness, GB 1 3
Setford, Steven John Inverness, GB 7 12
Sloss, Scott John Inverness, GB 1 3

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