INDIRECT TEMPERATURE MEASUREMENTS OF DIRECT BANDGAP (MULTIJUNCTION) SOLAR CELLS USING WAVELENGTH SHIFTS OF SUB-JUNCTION LUMINESCENCE EMISSION PEAKS
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United States of America Patent
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Issued Date -
Aug 22, 2013
app pub date -
Feb 13, 2013
filing date -
Feb 16, 2012
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Abandoned
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Abstract
Methods and structures may be used to measure operating temperatures of isolated cells and/or fully interconnected cells inside a Concentrator Photovoltaic (CPV) module. The method may use spectrometers to measure wavelength shifts of a sub-cell electro-luminescence and/or photo-luminescence emission spectrum. A sub-cells' intrinsic bandgap temperature-dependence relations may be used to indirectly compute the operating temperature of each subcell. A sub-cells' intrinsic bandgap temperature-dependence coefficients can be measured by performing quantum efficiency measurements and/or by recording the electro-luminescence and/or photo-luminescence emission profile of a solar cell at multiple temperatures.
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