NEUTRON ACTIVATION ANALYSIS USING A STANDARDIZED SAMPLE CONTAINER FOR DETERMINING THE NEUTRON FLUX

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United States of America Patent

APP PUB NO 20130208843A1
SERIAL NO

13810035

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for the non-destructive elemental analysis of large-volume samples using neutron radiation and a device for carrying out the method. In the method, the sample is irradiated with fast neutrons in a pulsed manner and the gamma radiation emitted by the sample is measured. The quantity of an element contained in the sample is evaluated after the background signal is subtracted from the area of the photopeak caused by the element in a plot of count rate versus energy. The gamma radiation emitted by a subregion of the sample, the composition of which is known, is evaluated in order to determine the neutron flux at the location of the sample. A metallic enclosure of the sample, such as a standardized waste container, can be selected as such a subregion, for example. A novel evaluation method based on multiparameter analysis can quantify, on the basis thereof, the presence of individual elements more quickly and more accurately than is possible according to the previous prior art. The device is characterized by a sample chamber, which is surrounded by a neutron-reflecting material, in particular graphite.

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Patent Owner(s)

Patent OwnerAddress
FORSCHUNGSZENTRUM JUELICH GMBHFACHBEREICH PATENTE JUELICH 52425

International Classification(s)

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  • 2011 Application Filing Year
  • G01N Class
  • 6853 Applications Filed
  • 5223 Patents Issued To-Date
  • 76.22 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201120122013201420152016201720182019202020212022202320240255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kettler, John Aachen, DE 2 4
Mauerhofer, Eric Juelich, DE 1 3

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  • 3 Citation Count
  • G01N Class
  • 9.02 % this patent is cited more than
  • 12 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges26316394571961235940442415163901 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0100200300400500600700800900100011001200130014001500160017001800

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