NEUTRON ACTIVATION ANALYSIS USING A STANDARDIZED SAMPLE CONTAINER FOR DETERMINING THE NEUTRON FLUX
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United States of America Patent
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N/A
Issued Date -
Aug 15, 2013
app pub date -
Jul 19, 2011
filing date -
Jul 22, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A method for the non-destructive elemental analysis of large-volume samples using neutron radiation and a device for carrying out the method. In the method, the sample is irradiated with fast neutrons in a pulsed manner and the gamma radiation emitted by the sample is measured. The quantity of an element contained in the sample is evaluated after the background signal is subtracted from the area of the photopeak caused by the element in a plot of count rate versus energy. The gamma radiation emitted by a subregion of the sample, the composition of which is known, is evaluated in order to determine the neutron flux at the location of the sample. A metallic enclosure of the sample, such as a standardized waste container, can be selected as such a subregion, for example. A novel evaluation method based on multiparameter analysis can quantify, on the basis thereof, the presence of individual elements more quickly and more accurately than is possible according to the previous prior art. The device is characterized by a sample chamber, which is surrounded by a neutron-reflecting material, in particular graphite.
First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
FORSCHUNGSZENTRUM JUELICH GMBH | FACHBEREICH PATENTE JUELICH 52425 |
International Classification(s)

- 2011 Application Filing Year
- G01N Class
- 6853 Applications Filed
- 5223 Patents Issued To-Date
- 76.22 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kettler, John | Aachen, DE | 2 | 4 |
# of filed Patents : 2 Total Citations : 4 | |||
Mauerhofer, Eric | Juelich, DE | 1 | 3 |
# of filed Patents : 1 Total Citations : 3 |
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Patent Citation Ranking
- 3 Citation Count
- G01N Class
- 9.02 % this patent is cited more than
- 12 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
---|---|---|---|---|
11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Feb 15, 2025 |
Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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