RESISTANCE MEASURING CIRCUIT, RESISTANCE MEASURING METHOD, AND IMPEDANCE CONTROL CIRCUIT
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United States of America Patent
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Aug 15, 2013
app pub date -
Dec 14, 2012
filing date -
Feb 14, 2012
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Abstract
A resistance measuring method includes: measuring a resistance value of a first path which is formed from an interface pad through a resistor unit to a ground node; measuring a resistance value of a second path which is formed from the interface pad to the ground node but does not pass through the resistor unit; and calculating a resistance value of the resistor unit by subtracting the resistance value of the second path from the resistance value of the first path.
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