SYSTEM AND METHOD OF PERFORMING ATOMIC FORCE MEASUREMENTS
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United States of America Patent
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Issued Date -
Aug 8, 2013
app pub date -
Feb 7, 2013
filing date -
Feb 7, 2012
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Abandoned
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Abstract
A system for performing atomic force measurements including: a sensor including: a beam having a first side and a second side, the beam including a tip positioned on a surface of the first side for interacting with a sample; and a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam; a light source optically coupled to an input of the sensor for inputting light; and an analyser coupled to an output of the sensor; wherein the beam and the interrogating grating coupler form a resonant cavity, a movement of the beam modulates the light source and the analyser determines a deflection of the beam according to the modulated light.
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