Systems and Methods for Feature Detection in Mass Spectrometry Using Singular Spectrum Analysis

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United States of America Patent

APP PUB NO 20130204582A1
SERIAL NO

13697787

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Abstract

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Singular spectrum analysis is used to detect a feature from mass spectrometry data. A plurality of scans of a sample is performed producing mass spectrometry data using a spectrometer. A singular spectrum analysis is performed on the mass spectrometry data using a fixed window width in which one or more components other than the highest ranked component are grouped in a set and the one or more components grouped in the set are summed producing reconstructed data using the processor. A feature of the mass spectrometry data is detected by analyzing an aspect of the reconstructed data using the processor. Analyzing an aspect of the reconstructed data includes using pairs of zero crossings in the reconstructed data to detect bounds on a location of the feature in the mass spectrometry data.

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Patent OwnerAddress
DH TECHNOLOGIES DEVELOPMENT PTE LTD33 MARSILING INDUSTRIAL ESTATE ROAD #04-06 SINGAPORE 739256

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ivosev, Gordana Etobicoke, US 37 43
Patel, Alpesh A San Francisco, US 3 31
Shilov, Ignat V Palo Alto, US 7 37

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