Lithographic Apparatus and Device Manufacturing Method

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20130194562A1
SERIAL NO

13879193

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Abstract

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A lithographic apparatus comprising a source of EUV radiation, an illumination system configured to condition a radiation beam, and a projection system configured to project the radiation beam onto a substrate, wherein the apparatus further comprises a filter configured to prevent or reduce the transmission of unwanted radiation and an apparatus configured to detect damage of the filter, wherein the damage detection apparatus comprises an antenna configured to receive radio waves and an analysis apparatus configured to determine the presence of filter damage based upon the received radio waves.

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Patent Owner(s)

Patent OwnerAddress
ASML NETHERLANDS B VP O BOX 324 VELDHOVEN 5500 AH

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Eurlings, Markus Franciscus Antonius Tilburg, NL 40 791
Neerhof, Hendrik Antony Johannes Eindhoven, NL 16 118

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