INDICATOR TESTING SYSTEM

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United States of America Patent

APP PUB NO 20130175434A1
SERIAL NO

13432474

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An indicator testing system for testing a plurality of indicators disposed on an electronic product and adapted to display a status includes a plurality of light sensors, a holder for holding the light sensors, and a signal processing module. The light sensors correspond in position to the indicators on the electronic product, respectively, and each generate a corresponding light testing signal whereby the signal processing module generates a brightness testing signal related to each indicator. The indicator testing system speeds up an indicator test, enhances the precision of the indicator test, and ensures the quality of the electronic product.

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Patent Owner(s)

Patent OwnerAddress
ASKEY COMPUTER CORP10F NO 119 JIANKANG RD ZHONGHE DISTRICT NEW TAIPEI CITY 235
ASKEY TECHNOLOGY (JIANGSU) LTDNO 1388 JIAOTONG ROAD WUJIANG ECONOMIC-TECHNOLOGICAL DEVELOPMENT AREA JIANGSU PROVINCE

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HSIEH, CHING-FENG TAIPEI CITY, TW 186 689
HUANG, WEI-HSIANG NEW TAIPEI CITY, TW 24 29
WU, CHENG-HUNG NEW TAIPEI CITY, TW 23 28

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