METHOD FOR CALIBRATING ALIGNMENT ERRORS OF AN EARTH OBSERVATION SYSTEM MAKING USE OF SYMMETRICAL EXPOSURES

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United States of America Patent

APP PUB NO 20130169808A1
SERIAL NO

13733392

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Abstract

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According to a first aspect, the invention relates to a method for calibrating alignment errors of a sight mark of an on-board imaging system inside an observation satellite, wherein a reference image of a scene is compared with a secondary image of the scene acquired by the imaging system,

    characterized in that the reference image and the secondary image consist of exposures of the scene acquired by the imaging system, the direction of motion of the observation satellite during the exposure of the secondary image being opposite to the direction of motion of the observation satellite during the exposure of the reference image.

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Patent Owner(s)

Patent OwnerAddress
CENTRE NATIONAL D'ETUDES SPATIALES75039 PARIS CEDEX 01

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Delvit, Jean-Marc Toulouse, FR 3 1

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