POLYCRYSTALLINE ALUMINUM NITRIDE BASE MATERIAL FOR CRYSTAL GROWTH OF GaN-BASE SEMICONDUCTOR AND METHOD FOR MANUFACTURING GaN-BASE SEMICONDUCTOR USING THE SAME

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United States of America Patent

APP PUB NO 20130157445A1
SERIAL NO

13806320

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Abstract

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There is provided a polycrystalline aluminum nitride base material having a linear expansion coefficient similar to GaN. The polycrystalline aluminum nitride base material as a substrate material for crystal growth of GaN-base semiconductors has a mean linear expansion coefficient of 4.9×10−6/K to 6.1×10−6/K between 20° C. and 600° C. and 5.5×10−6/K to 6.6×10−6/K between 20° C. and 1100° C.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA1-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-0023
TOSHIBA MATERIALS CO LTD8 SHINSUGITA-CHO ISOGO-KU YOKOHAMA-SHI KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aoki, Katsuyuki Yokohama-Shi, JP 51 442
Funaki, Kai Yokohama-Shi, JP 18 25
Komatsu, Michiyasu Yokohama-Shi, JP 49 677
Miyashita, Kimiya Fujisawa-Shi, JP 7 58

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