METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

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United States of America Patent

APP PUB NO 20130157385A1
SERIAL NO

13529306

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Abstract

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A method for fabricating a semiconductor device includes forming a bottom-electrode metal layer over a substrate, planarizing the bottom-electrode metal layer by a first thickness through a chemical mechanical polishing (CMP) process, etching the bottom-electrode metal layer by a second thickness through a wet etching process, forming a plurality of layers of a magnetic tunneling junction (MTJ) element over the bottom-electrode metal layer, forming a top electrode over the plurality of layers, and forming the MTJ element and a bottom electrode by etching the plurality of layers and the bottom-electrode metal layer using the top electrode as an etch mask.

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Patent Owner(s)

Patent OwnerAddress
HYNIX SEMICONDUCTOR INCGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
JUNG, Bo Kyoung Icheon-si, KR 14 142
Lee, Min Suk Seongnam-si, KR 39 256

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