METHOD OF PRODUCING GROUP III NITRIDE SEMICONDUCTOR GROWTH SUBSTRATE

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United States of America Patent

SERIAL NO

13750826

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Abstract

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An object of the present invention is to provide a method for producing a Group III nitride semiconductor epitaxial substrate, a Group III nitride semiconductor element, and a Group III nitride semiconductor free-standing substrate, which have good crystallinity, with not only AlGaN, GaN, and GaInN the growth temperature of which is 1050° C. or less, but also with AlxGa1-xN having a high Al composition, the growth temperature of which is high; a Group III nitride semiconductor growth substrate used for producing these, and a method for efficiently producing those. The present invention provides a Group III nitride semiconductor growth substrate comprising a crystal growth substrate including a surface portion composed of a Group III nitride semiconductor which contains at least Al, and a scandium nitride film formed on the surface portion are provided.

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Patent Owner(s)

Patent OwnerAddress
DOWA ELECTRONICS MATERIALS CO LTDTOKYO TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KADOWAKI, Yoshitaka Tokyo, JP 27 69
MIYASHITA, Masahito Tokyo, JP 10 73
TOBA, Ryuichi Tokyo, JP 28 105
TOYOTA, Tatsunori Tokyo, JP 14 41

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