NOR FLASH MEMORY CELL AND STRUCTURE THEREOF

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United States of America Patent

SERIAL NO

13717725

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Abstract

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The present invention provides a NOR flash memory cell. The NOR flash memory cell includes a a substrate, an active area, a first gate structure, a second gate structure and at least one third gate structure. The first gate structure covers a first partial region of the active area and is formed by a silicon-rich nitride material. The second gate structure covers a second partial region of the active area. The third gate structure covers a third partial region between a first opening and the first gate structure. The active area has the first opening, the first opening disposed on a first side of the first gate structure and the first side is not neighbor to the second gate structure. The NOR flash memory cell further comprises a first conducting structure for covering the first opening to form a bit line signal receiving terminal.

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Patent Owner(s)

Patent OwnerAddress
EMEMORY TECHNOLOGY INCROOM 305 NO 47 PARK AVENUE II RD HSINCHU SCIENCE PARK HSIN-CHU 300091

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wu, Meng-Yi Kaohsiung City, TW 62 592
Yang, Ching-Sung Hsinchu City, TW 99 877

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