Programmable test instrument

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United States of America Patent

PATENT NO 10776233
APP PUB NO 20130111505A1
SERIAL NO

13284491

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Abstract

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In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.

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Patent Owner(s)

  • TERADYNE, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Frick, Lloyd K Pepperell, US 7 69
Lind, David John North Andover, US 1 14

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