STRUCTURE FOR PARTICLE IMMOBILIZATION AND APPARATUS FOR PARTICLE ANALYSIS
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United States of America Patent
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Issued Date -
Apr 25, 2013
app pub date -
Jun 30, 2011
filing date -
Jun 30, 2010
priority date (Note) -
Abandoned
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Abstract
A structure 14 for particle immobilization has a plurality of holding holes 9 for holding respective test particles in order to detect light emitted from a substance which indicates the presence of a component for constructing each of the test particles, and the structure 14 for particle immobilization comprises a flat plate substrate 15, and a holding unit 20 which is arranged on the substrate 15 and which is formed with the plurality of holding holes 9. In this configuration, a light shielding film 19 which reduces light noise is provided for the substrate 15 or the holding unit 20 in order that the light noise such as the background noise and the crosstalk noise can be reduced, and a large number of test particles can be optically observed highly sensitively and highly accurately.
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