METHOD FOR POLISHING SILICON WAFER

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United States of America Patent

APP PUB NO 20130095660A1
SERIAL NO

13807082

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Abstract

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To final polish a finish-polished surface using a final polishing solution whose chief component is a weakly basic aqueous solution that does not contain abrasive grains. During the final polishing, the weakly basic aqueous solution having an alkali concentration that reduces a haze value of a final-polished surface below the haze value of the finish-polished surface of the wafer is used as the chief component of the final polishing solution.

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Patent Owner(s)

Patent OwnerAddress
SUMCO CORPORATION2-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-8634

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sadohara, Shinya Tokyo, JP 12 58
Takushima, Takeru Tokyo, JP 3 16
Tanimoto, Ryuichi Tokyo, JP 14 76

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