ANALYSIS DEVICE, ANALYSIS SYSTEM AND ANALYSIS METHOD

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United States of America Patent

SERIAL NO

13690182

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An analysis device of performing predetermined analysis processing to a sample. The analysis device includes: a first analysis unit, a second analysis unit and a simple analysis unit to perform at first analysis process to the sample, a second analysis process to the sample and a short-time analysis process to the sample, by which an analysis result is given in a shorter time than by the first analysis process, respectively; and a judging unit to judge, before a result of the first analysis process is given, whether or not to perform the second analysis process on a basis of a result of the first analysis process.

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Patent Owner(s)

Patent OwnerAddress
ARKRAY INC57 NISHIAKETA-CHO HIGASHIKUJO MINAMI-KU KYOTO-SHI KYOTO 601-8045

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujimoto, Koji Kyoto-shi, JP 126 1056
Furusato, Noriaki Kyoto-shi, JP 15 52

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