TESTING DEVICE FOR TESTING PLATES FOR ELECTRONIC CIRCUITS AND RELATIVE METHOD
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United States of America Patent
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Issued Date -
Apr 18, 2013
app pub date -
Oct 8, 2012
filing date -
Oct 18, 2011
priority date (Note) -
Abandoned
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Abstract
A testing device (100) is disclosed for testing wafers (11), comprising a measuring head (10) provided with three functional blocks (12, 13, 14), each able to move independently from the others, to carry out different resistive measurements on a cell or wafer (11). Each of the functional blocks (12, 13, 14) supports respective measuring probes (15), suitable to be placed into contact with metallization lines or fingers (16), made on the wafers (11).
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