CIRCUIT-TEST PROBE CARD AND PROBE SUBSTRATE STRUCTURE THEREOF
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United States of America Patent
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Issued Date -
Apr 4, 2013
app pub date -
Dec 6, 2011
filing date -
Sep 30, 2011
priority date (Note) -
Abandoned
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Abstract
A circuit-test probe card and a probe substrate structure thereof are disclosed herein to effectively narrow down the pitch of testing points of the circuit-test probe card. The circuit-test probe card utilizes the top and bottom surfaces of the probe substrate to respectively electrically connect with a circuit board and a plurality of probes. The probe substrate includes a main body having a plurality of upper contacts arranged on an upper surface thereof; and a plurality of wires penetrating the main body. Two ends of each wire are respectively exposed on the upper surface and a lower surface of the main body. The pitch of the wires exposed on the upper surface is larger than the pitch of the wires exposed on the lower surface. The wires are respectively electrically connected with the upper contacts.
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