THREE DIMENSIONAL PATTERN INSPECTION SYSTEM
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United States of America Patent
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Issued Date -
Mar 28, 2013
app pub date -
Sep 26, 2012
filing date -
Sep 26, 2011
priority date (Note) -
Abandoned
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Abstract
An inspection system of a printed substrate, the printed substrate at least includes a three-dimensional pattern, the system includes a light source, for emitting light beams toward the substrate, the light beams being substantially aligned when impinging on the substrate, an imager, for acquiring an image of the substrate, the image including a representation of the three-dimensional pattern and of the matter printed on the substrate and a processor, coupled with the light source and the imager, for processing the acquired image to determine the correctness of the three-dimensional pattern.
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