Dynamic RF Power Measurement with Visualization
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United States of America Patent
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Issued Date -
Mar 28, 2013
app pub date -
Sep 26, 2011
filing date -
Sep 26, 2011
priority date (Note) -
Abandoned
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Abstract
Embedded systems that utilize RF are often times difficult to troubleshoot as the signals cannot be easily probed without special equipment. Embodied in this patent is a tool that allows the embedded systems designer to troubleshoot these said RF designs. A combined spectrum analyzer and dynamic power meter. These are two of the most important tools that a designer needs when doing RF protocol development. This, coupled with an intuitive/simple to use graphical user interface, provides the ideal tool for RF engineering doing embedded systems design, product verification, and protocol design.
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