INTEGRATED CIRCUIT TEST SOCKET HAVING TEST PROBE INSERTS
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United States of America Patent
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Issued Date -
Mar 21, 2013
app pub date -
Sep 14, 2012
filing date -
Sep 16, 2011
priority date (Note) -
Abandoned
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Abstract
A test socket having a lid and a base with a cavity for receipt of an integrated circuit and removable test probe inserts having test probes positioned around a perimeter of the cavity.
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