Electrostatic shielding technique on high voltage diodes
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United States of America Patent
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Dec 16, 2014
Issued Date -
N/A
app pub date -
Sep 19, 2011
filing date -
Sep 19, 2011
priority date (Note) -
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Abstract
A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.
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International Classification(s)
- 2011 Application Filing Year
- H01R Class
- 3081 Applications Filed
- 2229 Patents Issued To-Date
- 72.35 % Issued To-Date
Cited Art Landscape
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- 0 Citation Count
- H01R Class
- 0 % this patent is cited more than
- 11 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jun 16, 2026 |
