Memory and Method of Adjusting Operating Voltage thereof
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United States of America Patent
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Issued Date -
Mar 14, 2013
app pub date -
Sep 14, 2011
filing date -
Sep 14, 2011
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Abandoned
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Abstract
By adjusting an operating voltage of a memory cell in a memory according to a measured capacitance result indicating capacitance of an under-test capacitor of the memory cell, an appropriate operating voltage for the memory cell can always be determined according to the measured capacitance result. The measured capacitance result indicates whether the capacitance of the under-test capacitor indicating the characteristic of the gate dielectric of the memory cell is higher or lower than a reference capacitor, and is generated by amplifying a difference between two voltages indicating capacitance of the reference capacitor and the capacitance of the under-test capacitor.
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