SENSOR AND A METHOD FOR CHARACTERISING A DIELECTRIC MATERIAL
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United States of America Patent
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Issued Date -
Mar 14, 2013
app pub date -
Mar 11, 2011
filing date -
Mar 17, 2010
priority date (Note) -
Abandoned
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Abstract
The present disclosure provides a method of characterising a dielectric material. The method comprises the step of providing a light source, a light collector and a sensor. The sensor is arranged so that an evanescent field of light penetrates through a surface of the sensor and surface plasmons are generated at the surface of the sensor when suitable light is directed along at least a portion of the sensor. The method also includes the step of exposing the surface of the sensor to the dielectric material so that an interface is formed between the surface and the dielectric material. Further, the method comprises guiding light along at least a portion of the sensor to generate the surface plasmons. In addition, the method comprises the step of collecting an intensity of light from the interface as a function of a spectral parameter of the light. Further, the present disclosure provides an apparatus for characterising the dielectric material in accordance with the method.
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