APPARATUS FOR TESTING ELECTRONIC POWER SYSTEMS
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United States of America Patent
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Issued Date -
Mar 7, 2013
app pub date -
Sep 2, 2011
filing date -
Sep 2, 2011
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Abandoned
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Abstract
A transistorized load system for testing electronic power systems devices includes at least one field effect transistor that is microprocessor-controlled for simulating the current drawn by a specific product on an electronic power source. The transistorized load system is capable of accepting command information either manually or from a personal computer derived source, and determining the exact value of current drawn from the electrical power system under test. The transistorized load may accept values for a desired resistance value in ohms, and/or a desired capacitance value in farads. Once voltage is applied across the positive and negative terminals of the transistorized load, the microprocessor controls the current drawn from the device under test.
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