APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT
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United States of America Patent
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Issued Date -
Feb 21, 2013
app pub date -
Aug 19, 2011
filing date -
Aug 19, 2011
priority date (Note) -
Abandoned
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Abstract
A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal between said web and the electronic component being tested when the electronic component in installed in the wrap. A closure disposed on the ends may be reversibly closed sufficiently tightly to promote the thermal seal.
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