Silicon Chip Having Through Via and Method for Making the Same

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United States of America Patent

SERIAL NO

13569882

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Abstract

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The present invention relates to a silicon chip including a silicon substrate, a passivation layer, at least one electrical device and at least one through via. The passivation layer is disposed on a first surface of the silicon substrate. The electrical device is disposed in the silicon substrate, and exposed to a second surface of the silicon substrate. The through via includes a barrier layer and a conductor, and penetrates the silicon substrate and the passivation layer. A first end of the through via is exposed to the surface of the passivation layer, and a second end of the through via connects the electrical device. When a redistribution layer is formed on the surface of the passivation layer, the redistribution layer will not contact the silicon substrate, thus avoiding a short circuit.

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Patent Owner(s)

Patent OwnerAddress
ADVANCE SEMICONDUCTOR ENGINEERING INC26 CHIN 3RD RD 811 NANTZE EXPORT PROCESSING ZONE KAOHSIUNG R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chien-Hua Kaohsiung, TW 409 6054
Chen, Pei-Chun Kaohsiung, TW 24 246
Yang, Hsueh-An Kaohsiung, TW 18 310

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