OBJECT INSPECTION WITH REFERENCED VOLUMETRIC ANALYSIS SENSOR
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United States of America Patent
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Issued Date -
Jan 31, 2013
app pub date -
May 3, 2011
filing date -
May 4, 2010
priority date (Note) -
Abandoned
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Abstract
A positioning method and system for non-destructive inspection of an object include providing at least one volumetric analysis sensor having sensor reference targets; providing a sensor model of a pattern of at least some of the sensor reference targets; providing object reference targets on at least one of the object and an environment of the object; providing an object model of a pattern of at least some of the object reference targets; providing a photogrammetric system including at least one camera and capturing at least one image in a field of view, at least a portion of the sensor reference and the object reference targets being apparent on the image; determining a sensor spatial relationship and an object spatial relationship; determining a sensor-to-object spatial relationship of the at I act one volumetric analysis sensor with respect to the object; repeating the steps and tracking a displacement of the volumetric analysis sensor and the object.
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