OPTICAL MEASUREMENT SYSTEM AND THE DEVICE THEREOF
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United States of America Patent
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N/A
Issued Date -
Dec 20, 2012
app pub date -
Oct 4, 2011
filing date -
Jun 17, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The invention discloses an optical measurement system for measuring the optical properties of a device under test (DUT). The optical measurement system includes a DUT, a light measuring module, a light guiding module and an analyzing module. The present invention utilizes the light guiding module to receive an axial ray of the rays emitted by the DUT so as to analyze the optical properties thereof. Thus, the present invention is not only capable of measuring the light intensity of the rays emitted by the DUT, but also capable of obtaining the properties of the axial ray emitted by the DUT.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
CHROMA ATE INC | NO 88 WENMAO RD GUISHAN DIST TAOYUAN CITY 333001 |
International Classification(s)

- 2011 Application Filing Year
- G01J Class
- 1310 Applications Filed
- 892 Patents Issued To-Date
- 68.10 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Cheng, Hsu-Ting | Taoyuan Hsien, TW | 6 | 49 |
# of filed Patents : 6 Total Citations : 49 | |||
Tseng, I-Shih | Taoyuan Hsien, TW | 18 | 62 |
# of filed Patents : 18 Total Citations : 62 | |||
Wang, Tsun-I | Taoyuan Hsien, TW | 37 | 313 |
# of filed Patents : 37 Total Citations : 313 |
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Patent Citation Ranking
- 1 Citation Count
- G01J Class
- 5.60 % this patent is cited more than
- 13 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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