MANUFACTURING METHOD FOR SEMICONDUCTOR WAFER

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United States of America Patent

APP PUB NO 20120315739A1
SERIAL NO

13581011

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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All treatments performed in machining processes other than a polishing process are performed while pure water free from free abrasive grains is supplied. Thus, an amount of abrasive grains included in a used processing liquid discharged in each process is reduced and semiconductor scraps are collected from the used slurry for recycling.

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Patent Owner(s)

Patent OwnerAddress
SUMCO CORPORATION2-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-8634

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hashii, Tomohiro Tokyo, JP 41 170
Kakizono, Yuichi Tokyo, JP 11 49
Kurosawa, Yoshiaki Tokyo, JP 40 749

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