SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

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United States of America Patent

APP PUB NO 20120313158A1
SERIAL NO

13380666

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Abstract

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The present invention provides a semiconductor structure and a method for manufacturing the same. The method comprises: providing a substrate, forming sequentially a first high-k dielectric layer, an adjusting layer, a second high-k dielectric layer and a metal gate on the substrate, etching the first high-k dielectric layer, the adjusting layer, the second high-k dielectric layer and the metal gate to form a gate stack. Accordingly, the present invention further provides a semiconductor structure. The present invention proposes to arrange an adjusting layer between two layers of high-k dielectric layer, which effectively avoids reaction of the adjusting layer with the metal gate because of their direct contact, so as to maintain the performance of semiconductor devices.

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Patent Owner(s)

Patent OwnerAddress
BEIJING NMC CO LTDNO 8 WENCHANG AVENUE BEIJING ECONOMIC-TECHNOLOGICAL DEVELOPMENT AREA BEIJING 100176
INSTITUTE OF MICROELECTRONICS CHINESE ACADEMY OF SCIENCESNO 3 BEITUCHENG WEST ROAD BEIJING 100029

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Luo, Zhijiong Poughkeepsie, US 255 4762
Yin, Haizhou Poughkeepsie, US 244 3095
Zhu, Huilong Poughkeepsie, US 705 13304

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