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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
ION BEAM APPLICATIONS S A	1348 LOUVAIN-LA-NEUVE

International Classification(s)

• A61N:ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY;....
• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Brusasco, Caterina	Bossiere, BE	11	444
# of filed Patents : 11 Total Citations : 444
Fontbonne, Jean-Marc	Caen, FR	5	21
# of filed Patents : 5 Total Citations : 21
Marchand, Bruno	Mamaroneck, US	5	641
# of filed Patents : 5 Total Citations : 641
Perronnel, Jérôme	Herouville-Saint-Clair, FR	1	4
# of filed Patents : 1 Total Citations : 4

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Patent Citation Ranking

• 4 Citation Count
• A61N Class

• 0.48 % this patent is cited more than
• 13 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

Full Text

US Patent Application No: 2012/0310,030

Device And Method For Line Control Of An Energy Beam

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Abstract

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The invention relates to the field of line control of a beam, and especially to a device comprising a plurality of ionisation chambers, enabling the measurement of the dose deposited by an ionising beam and the field of said beam. At least one ionisation chamber is formed from support films having a thickness less than or equal to 100 nm.

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Description

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Claims

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