Sample preparation for isotopic analysis without an oxidizer
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United States of America Patent
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Issued Date -
Dec 6, 2012
app pub date -
May 31, 2011
filing date -
May 31, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A sample preparation chamber for gas analysis that includes a heating element within is provided. The heating element is maintained at an elevated temperature, such that organic compounds that may be present in an input gas sample are removed via oxidation and/or thermal decomposition to provide a treated gas sample that is substantially free of organic contaminants. The treated gas sample may then be analyzed in a gas analysis instrument (e.g., an optical spectroscopic instrument, a mass spectrometer, etc.) to provide results that are free from interference due to organic contaminants. Preferably, the heating element is configured as a Ni—Cr wire. An important feature of this approach is that the heating element (and the rest of the sample preparation chamber) are not altered in operation to remove the organic compounds.
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