Spectrometer Calibration System and Method
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United States of America Patent
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Issued Date -
Dec 6, 2012
app pub date -
Apr 26, 2012
filing date -
May 31, 2011
priority date (Note) -
Abandoned
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Abstract
A spectrometer calibration system and method that permits a database of spectral peak shapes to be applied as basis template functions to characterize a radiation detector is disclosed. The disclosed system/method interpolates stored arrays representing a series of spectral peak shapes at a range of specified energies to enable formation of a calibration peak shape template at any desired spectral energy level. These basis functions may be generated from analytical functions and/or empirically measured spectral data and produce output shape calibration templates that are independent of the generation method for the basis templates. The disclosed system/method acts as an abstraction layer between the method of peak shape determination and the use of the peak shape basis functions in any subsequent spectroscopic analysis, permitting rapid and inexpensive spectrometer calibration updates without the need for any embedded spectrometer software modifications.
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