SYSTEM AND METHOD FOR NON-DESTRUCTIVE TESTING

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20120303333A1
SERIAL NO

13116946

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Abstract

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Non-destructive testing and examination systems and methods generate models and other representations of a part. These models can be used to perform analysis such as defect detection and categorization. The present disclosure identifies, in one embodiment, a method and system that identifies particular locations on the part for analysis. These locations correspond to regions of a reference model, which may comprise a representation of the part that a computer aided design (CAD) package can generate. The method provides for test parameters to be assigned or associated with the region so as to direct and instruct the execution of the relevant part analysis protocols. In one example, the test parameters identify criteria for one or more types of defects that may be found on the part.

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Patent Owner(s)

Patent OwnerAddress
GENERAL ELECTRIC COMPANY1 NEUMANN WAY EVENDALE OH 45215

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beyer, Andreas Hamburg, DE 36 215
Horn, Lothar Ahrensburg, DE 1 5
Lux, Holger Bargteheide, DE 2 27
Stuke, Ingo Reinfeld, DE 7 49
Wuestenbecker, Michael Lutiensee, DE 7 53

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