METHODS AND SYSTEMS FOR MEASURING A NUMBER OF LAYERS OF A MULTILAYER MATERIAL
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United States of America Patent
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Issued Date -
Nov 29, 2012
app pub date -
May 26, 2011
filing date -
May 26, 2011
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Abandoned
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Abstract
Methods and corresponding systems are provided for determining a ply count of a multilayer material is provided that includes: placing the multilayer material between an emitter and a detector of a gauge; emitting at least one pulse of ionized radiation from a source associated with the emitter; detecting a number of particles emitted from the emitter passing through the multilayer material placed between the emitter and the detector; and translating the number of particles detected into a ply count using a computing device.
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